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Modeling of Evaporation of Thin Films Using DOE
(IEEE, 2006-05)
Evaporation of thin films is widely spread technology. The goal of the work has been to optimize a process of fabrication of thin resistive Ni films. Mathematical models for calculation of thickness and resistance of the ...
Equipment for measurement of nonlinearity of nominally linear components
(IEEE, 2006-05)
Nonlinearity of a nominally linear component is a significant parameter, which informs about the difference of and investigated component from an ideal one. The higher is quality of the nominally linear component; the lower ...