Now showing items 1-2 of 2

    • Equipment for measurement of nonlinearity of nominally linear components 

      Author: Mach, Pavel; Papež, Václav; Bušek, David; Duraj, Aleš
      (IEEE, 2006-05)
      Nonlinearity of a nominally linear component is a significant parameter, which informs about the difference of and investigated component from an ideal one. The higher is quality of the nominally linear component; the lower ...
    • Modeling of Evaporation of Thin Films Using DOE 

      Author: Mach, Pavel; Kocián, Miroslav
      (IEEE, 2006-05)
      Evaporation of thin films is widely spread technology. The goal of the work has been to optimize a process of fabrication of thin resistive Ni films. Mathematical models for calculation of thickness and resistance of the ...