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    • Transient Effects on High Voltage Diode Stack under Reverse Bias 

      Author: Papež, V.; Kojecký, B.; Kožíšek, J.; Hejhal, J.
      (2003)
      This article deals with a description and analysis of the fast transient processes which can occur during a local non-destructive breakdown in a circuit arranged by serial connection of reverse biased high-voltage silicon ...