Testovatelnost a fyzická bezpečnost: řešení na úrovni standardních buněk
Testability and Physical Security:The Cell-Level Approach
dc.contributor.advisor | Fišer Petr | |
dc.contributor.author | Jan Bělohoubek | |
dc.date.accessioned | 2022-01-13T23:19:13Z | |
dc.date.available | 2022-01-13T23:19:13Z | |
dc.date.issued | 2022-01-14 | |
dc.identifier | KOS-589460263805 | |
dc.identifier.uri | http://hdl.handle.net/10467/99059 | |
dc.description.abstract | Reliability, testability, and security belong to the most signifcant digital design challenges. Notable testability and security problems originate at the physical level, while the solutions may be implemented at higher levels. This dissertation thesis deals with low-level approaches addressing the high-level design problems, namely the problem of the oine test length and fault coverage, and the problem of the physical security. The proposed solutions are based on enhanced CMOS structures. This dissertation thesis includes also a vulnerability analysis of the conventional CMOS circuit static power and established dynamic power countermeasures such as WDDL or SecLib. A particular contribution touches also on the security-reliability interplay. | cze |
dc.description.abstract | Reliability, testability, and security belong to the most signifcant digital design challenges. Notable testability and security problems originate at the physical level, while the solutions may be implemented at higher levels. This dissertation thesis deals with low-level approaches addressing the high-level design problems, namely the problem of the oine test length and fault coverage, and the problem of the physical security. The proposed solutions are based on enhanced CMOS structures. This dissertation thesis includes also a vulnerability analysis of the conventional CMOS circuit static power and established dynamic power countermeasures such as WDDL or SecLib. A particular contribution touches also on the security-reliability interplay. | eng |
dc.publisher | České vysoké učení technické v Praze. Vypočetní a informační centrum. | cze |
dc.publisher | Czech Technical University in Prague. Computing and Information Centre. | eng |
dc.rights | A university thesis is a work protected by the Copyright Act. Extracts, copies and transcripts of the thesis are allowed for personal use only and at one?s own expense. The use of thesis should be in compliance with the Copyright Act http://www.mkcr.cz/assets/autorske-pravo/01-3982006.pdf and the citation ethics http://knihovny.cvut.cz/vychova/vskp.html | eng |
dc.rights | Vysokoškolská závěrečná práce je dílo chráněné autorským zákonem. Je možné pořizovat z něj na své náklady a pro svoji osobní potřebu výpisy, opisy a rozmnoženiny. Jeho využití musí být v souladu s autorským zákonem http://www.mkcr.cz/assets/autorske-pravo/01-3982006.pdf a citační etikou http://knihovny.cvut.cz/vychova/vskp.html | cze |
dc.subject | combined attack | cze |
dc.subject | data-dependency | cze |
dc.subject | domino logic | cze |
dc.subject | dynamic logic | cze |
dc.subject | error detection | cze |
dc.subject | errorcorrection | cze |
dc.subject | fault | cze |
dc.subject | fault coverage | cze |
dc.subject | fault model | cze |
dc.subject | invasive attack | cze |
dc.subject | oine test | cze |
dc.subject | optical beaminduced current | cze |
dc.subject | online test | cze |
dc.subject | power analysis | cze |
dc.subject | power imprint | cze |
dc.subject | self-checking | cze |
dc.subject | side-channel | cze |
dc.subject | standard cell | cze |
dc.subject | combined attack | eng |
dc.subject | data-dependency | eng |
dc.subject | domino logic | eng |
dc.subject | dynamic logic | eng |
dc.subject | error detection | eng |
dc.subject | errorcorrection | eng |
dc.subject | fault | eng |
dc.subject | fault coverage | eng |
dc.subject | fault model | eng |
dc.subject | invasive attack | eng |
dc.subject | oine test | eng |
dc.subject | optical beaminduced current | eng |
dc.subject | online test | eng |
dc.subject | power analysis | eng |
dc.subject | power imprint | eng |
dc.subject | self-checking | eng |
dc.subject | side-channel | eng |
dc.subject | standard cell | eng |
dc.title | Testovatelnost a fyzická bezpečnost: řešení na úrovni standardních buněk | cze |
dc.title | Testability and Physical Security:The Cell-Level Approach | eng |
dc.type | disertační práce | cze |
dc.type | doctoral thesis | eng |
dc.contributor.referee | Renovell Michel | |
theses.degree.discipline | Informatika | cze |
theses.degree.grantor | katedra číslicového návrhu | cze |
theses.degree.programme | Informatika | cze |