Prohlížení Publikační činnost - 13113 dle autora "Hájek, J."
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Capacitive methodes for testing of power semiconductor devices
Autor: Papež, V.; Hájek, J.; Kopecký, B.
(2015)Electrical capacity of power semiconductor devices is quite an important parameter that can be utilized not only for testing a component itself, but it can also be applied practically; e.g. in series-connected high voltage ...