• Comparison of MOSFET Gate Waffle Patterns Based on Specific On-Resistance 

      Autor: Vacula P.; Kotě V.; Barri D.; Vacula M.; Husák M.; Jakovenko J.; Privitera S.
      (České vysoké učení technické v Praze, Fakulta elektrotechnická, 2019)
      This article describes waffle power MOSFET segmentation and defines its analytic models. Although waffle gate pattern is well-known architecture for effective channel scaling without requirements on process modification, ...