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Influence of Magnetostriction of NiFe Electroplated Film on the Noise of Fluxgate



dc.contributor.authorButta M.
dc.contributor.authorJanošek M.
dc.contributor.authorRipka P.
dc.contributor.authorKraus L.
dc.contributor.authorEl Kammouni R.
dc.date.accessioned2019-03-30T19:14:11Z
dc.date.available2019-03-30T19:14:11Z
dc.date.issued2014
dc.identifierV3S-223377
dc.identifier.citationBUTTA, M., et al. Influence of Magnetostriction of NiFe Electroplated Film on the Noise of Fluxgate. IEEE Transactions on Magnetics. 2014, 50(44), ISSN 0018-9464. DOI 10.1109/TMAG.2014.2327105.
dc.identifier.issn0018-9464 (print)
dc.identifier.issn1941-0069 (online)
dc.identifier.urihttp://hdl.handle.net/10467/81784
dc.description.abstractWe electroplated NiFe thin-film over a copper layer using different current density. Magnetostriction is changed from negative to positive values, with minimum magnetostriction found at around Fe19Ni81 composition. When we used these ring cores as base for a fluxgate we observed that the noise rapidly rises as the absolute value of magnetostriction increases, while the minimum noise is achieved at lowest value of magnetostriction.eng
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherIEEE
dc.relation.ispartofIEEE Transactions on Magnetics
dc.subjectmagnetostrictioneng
dc.subjectelectroplatedeng
dc.subjectfluxgateeng
dc.subjectnoiseeng
dc.titleInfluence of Magnetostriction of NiFe Electroplated Film on the Noise of Fluxgateeng
dc.typečlánek v časopisecze
dc.typejournal articleeng
dc.identifier.doi10.1109/TMAG.2014.2327105
dc.relation.projectidinfo:eu-repo/grantAgreement/Czech Science Foundation/GA/GAP102%2F12%2F2177/CZ/Nanostructured soft magnetic materials for sensors/
dc.rights.accessopenAccess
dc.identifier.wos000349465900257
dc.type.statusPeer-reviewed
dc.type.versionacceptedVersion
dc.identifier.scopus2-s2.0-84916239689


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