Now showing items 1-2 of 2

    • ZATPG: SAT-based ATPG for Zero-Aliasing Compaction 

      Author: Hülle R.; Fišer P.; Schmidt J.
      (ČVUT v Praze, Fakulta informačních technologií, 2018)
      One of long-standing problems in digital circuit testing is fault aliasing in the response compaction. Fault aliasing is an important source of coverage loss, especially if we strive to achieve high compaction ratio. ...
    • ZATPG: SAT-based Test Patterns Generator with Zero-Aliasing in Temporal Compaction 

      Author: Hülle R.; Fišer P.; Schmidt J.
      (Elsevier Science, 2018)
      Aliasing in test response compaction is an important source of fault coverage loss. Methods to avoid the aliasing mostly require modification of the compactor to some extent. This can lead to a higher compactor complexity ...