Recently, the human body model - electrostatic discharge (HBM-ESD) test capability for power diodes
was introduced among the requirements in the field of automotive include for a superior reliability.
During the HBM-ESD test, the DUT works in avalanche conditions and it is still not well understood the
failure modality occurring in power diodes. The available commercial HBM-ESD testers only give
information about the maximum voltage rate, without any specific measurement of electrical waveforms.
In this work we present a HBM - ESD tester for the characterization of power semiconductor devices up
to 6 kV. In the proposed tester both the voltage and current DUT waveforms are measured, for a further
gain of the failure analysis in power diodes.
en
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en
en
dc.publisher
České vysoké učení technické v Praze. České centrum IET
cze
dc.title
Development of an HBM-ESD tester for power semiconductor devices
en
dc.title.alternative
15th INTERNATIONAL SEMINAR ON POWER SEMICONDUCTORS