• Current Instabilities in Large-Area Silicon Diodes: An Accurate TCAD Approach 

      Autor: Balestra, Luigi; Reggiani, Susanna; Gnudi, Antonio; Gnani, Elena; Vobecký, Jan; Vemulapati, Umamaheswara
      (České vysoké učení technické v Praze. České centrum IET, 2021)
      Fast-recovery diodes can exhibit negative differential resistance during reverse recovery which is associated with the formation of current filaments triggered by the presence of inhomogeneities along the ...