Improvement of Column-Parallel Sampling for A Monolithic Pixel Detector

Abstract

Monolithic pixel detectors often use an on-chip analog to digital converter (ADC) with successive approximation register (SAR) to digitize the signal amplitude of the pixels. This paper solves the challenges of column-parallel sampling with respect to the layout, power consumption, process variability, speed, and the integration of fully differential ADC architecture with ADC driver.