BĚLOHOUBEK, J., P. FIŠER, and J. SCHMIDT. Error Masking Method Based On The Short-Duration Offline Test. Microprocessors and Microsystems. 2017, 52 236-250. ISSN 0141-9331. DOI 10.1016/j.micpro.2017.06.007.
The method proposed in this article allows to construct error-masking fail-operational systems by com- bining time and area redundancy. In such a system, error detection is performed online, while error masking is achieved by a short-duration offline test. The time penalty caused by the offline test applies only when an error is detected. The error-masking ability in such a system is very close to TMR, the area overhead is smaller for a well defined class of circuits, and the delay penalty caused by the offline test remains reasonably small. The short-duration offline test is possible only when extensive design-for-test practices are used. Therefore, a novel gate structure is presented, which allows to construct combina- tional circuits testable by a short-duration offline test. The proposed test offers com plete fault coverage with respect to the stuck-on and stuck-open fault model. The proposed solutions are combined and a comprehensive description of the overall error-masking architecture is provided.
eng
dc.format.mimetype
application/pdf
dc.language.iso
eng
dc.publisher
Elsevier Science
dc.relation.ispartof
Microprocessors and Microsystems
dc.subject
error masking
eng
dc.subject
TMR
eng
dc.subject
TED
eng
dc.subject
dual-rail
eng
dc.subject
short-duration off-line test
eng
dc.title
Error Masking Method Based On The Short-Duration Offline Test
info:eu-repo/grantAgreement/Czech Science Foundation/GA/GA16-05179S/CZ/Fault-Tolerant and Attack-Resistant Architectures Based on Programmable Devices: Research of Interplay and Common Features/