• Spatial Systematic Mismatch Assessment of Pre-arranged Layout Topologies 

      Autor: Vančura P.; Jakovenko J.; Kotě V.; Vacula P.; Kubačák A.
      (Elsevier, 2020)
      A spatial systematic mismatch, occurring in the integrated circuit manufacturing process, leads to differences in parameters for two or more identical devices. It is widely accepted that placing devices into symmetrical ...