Prohlížení Publikační činnost ČVUT dle autora "Jakovenko J."

Zobrazují se záznamy 1-7 z 7

    • Comparison of MOSFET Gate Waffle Patterns Based on Specific On-Resistance 

      Autor: Vacula P.; Kotě V.; Barri D.; Vacula M.; Husák M.; Jakovenko J.; Privitera S.
      (České vysoké učení technické v Praze, Fakulta elektrotechnická, 2019)
      This article describes waffle power MOSFET segmentation and defines its analytic models. Although waffle gate pattern is well-known architecture for effective channel scaling without requirements on process modification, ...

    • Design and Optimization of an Active OTA-C Filter Based on STOHE Algorithm 

      Autor: Barri D.; Jakovenko J.
      (University of West Bohemia, 2019)
      With increasing demands on design and optimization of analog circuits in real applications, a limited number of algorithms for practical use have been presented. The drawbacks of already existing standard algorithms are ...

    • Improvement of Column-Parallel Sampling for A Monolithic Pixel Detector 

      Autor: Vančura P.; Havránek M.; Jakovenko J.
      (IOP Publishing Ltd, 2020)
      Monolithic pixel detectors often use an on-chip analog to digital converter (ADC) with successive approximation register (SAR) to digitize the signal amplitude of the pixels. This paper solves the challenges of column-parallel ...

    • Improvements in the Electrical Performance of IC MOSFET Components Using Diamond Layout Style Versus Traditional Rectangular Layout Style Calculated by Conformal Mapping 

      Autor: Barri D.; Vacula P.; Kotě V.; Jakovenko J.; Voves J.
      (IEEE, 2019)
      In the first part of this article, we have proposed an innovative approach to improve the drain current model of the MOSFETs implemented with the diamond layout style (DLS), regarding the longitudinal corner effect (LCE). ...

    • Spatial Systematic Mismatch Assessment of Pre-arranged Layout Topologies 

      Autor: Vančura P.; Jakovenko J.; Kotě V.; Vacula P.; Kubačák A.
      (Elsevier, 2020)
      A spatial systematic mismatch, occurring in the integrated circuit manufacturing process, leads to differences in parameters for two or more identical devices. It is widely accepted that placing devices into symmetrical ...

    • Thermal Management Strategies for Low- and High-Voltage Retrofit LED Lamp Drivers 

      Autor: Perpina X.P.; Vellvehi M.H.; Werkhoven R.; Jakovenko J.; Kunen J.; Bancken P.; Bolt P.; Jorda X.
      (IEEE Press, 2019)
      Several thermal management strategies for LED drivers designed for high lumen retrofit LED lamps are studied by simulation and experimentation means. Depending on the driver output, two scenarios are analyzed: Low Voltage-High ...

    • Time of flight measurements with the PH32 chip 

      Autor: Janoška Z.; Benka T.; Havránek M.; Hejtmánek M.; Jakovenko J.; Kafka V.; Kaschner M.; Marčišovská M.; Marčišovský M.; Neue G.; Tomášek L.; Švihra P.; Vančura P.; Vrba V.
      (IOP Publishing Ltd, 2019)
      The front-end readout chip PH32, that is suitable for the measurement of {X-rays}, beta radiation and ions, is primarily dedicated to the dose rate measurement and basic spectroscopy. This article is focused on the ...