Reflection from a Gold Sputtered Thin Layer
Type of document
příspěvek z konference - elektronickýAuthor
Buchar, Pavel
Macháč, Jan
Zehentner, Ján
Slepička, Petr
Švorčík, Václav
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© 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Metadata
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This paper presents the results of an investigation of a thin layer of gold sputtered on a dielectric foil. This layer is modeled by nanometer-scale spherical particles that are separated at short deposition times and later touch each other, forming a continuous layer. Four ways of analyzing the structure are introduced. The first method describes the spheres by their electric dipole moment, while the second, newly proposed method, takes into account the capacity between adjacent spheres, and the third method assumes the layer as homogeneous and considers its reduced conductivity due to the behavior of electrons in thin films. The CST microwave studio model, which takes into account the random distribution of particles, offers the reflection coefficient that best fits measured data.
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