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dc.contributor.authorZehentner, Ján
dc.contributor.authorMacháč, Jan
dc.contributor.authorMrkvica, Jan
dc.contributor.authorSarnowski, Marcin K.
dc.contributor.authorPolívka, Jiří
dc.date.accessioned2012-08-07T11:33:34Z
dc.date.available2012-08-07T11:33:34Z
dc.date.issued1998-10
dc.identifier.citationZehentner J., Macháč J., Sarnowski M., Mrkvica J., Polivka J.: Surface leaky waves and their measurement, Proceedings of the 28th European Microwave Conference, Amsterodam, Netherlands, October 1998, Vol. 2, pp. 561-564.cze
dc.identifier.urihttp://hdl.handle.net/10467/12452
dc.description.abstractA new approach to experimental identification of surface leaky waves on printed-circuit lines is presented in this paper. Active radiometry is used for field probing even in the near field zone. The measurement is adjusted into the X band. The method is demonstrated on the slotline. Consequently the line is scaled in order to investigate the 1st and 2nd leaky waves which, on a standard-sized substrate, occur in the mm-wave range only. The high rate of polarization distinctness of the probe enables us to distinguish particular field components. We present the first very promising results.eng
dc.language.isocescze
dc.publisherIEEEcze
dc.rights© 1998 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.eng
dc.titleSurface leaky waves and their measurementcze
dc.typepříspěvek z konference - tištěnýcze
dc.identifier.doi10.1109/EUMA.1998.338214


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