MAŠEK, V. and M. NOVOTNÝ. Versatile Hardware Framework for Elliptic Curve Cryptography. In: BĚLOHOUBEK, J. and J. BORECKÝ, eds. Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Praha, 2022-04-06/2022-04-08. Piscataway: IEEE, 2022. p. 80-83. ISSN 2473-2117. ISBN 978-1-6654-9431-1.
We propose versatile hardware framework for ECC. The framework supports arithmetic operations over P-256, Ed25519 and Curve25519 curves, enabling easy implementation of various ECC algorithms. Framework finds its application area e.g. in FIDO2 attestation or in nowadays rapidly expanding field of hardware wallets. As the design is intended to be ASIC-ready, we designed it to be area efficient. Hardware units are reused for calculations in several finite fields, and some of them are superior to previously designed circuits in terms of time-area product. The framework implements several attack countermeasures. It enables implementation of certain countermeasures even in later stages of design. The design was validated on SoC FPGA.
eng
dc.format.mimetype
application/pdf
dc.language.iso
eng
dc.publisher
IEEE
dc.relation.ispartof
Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
dc.subject
Elliptic curve cryptography
eng
dc.subject
Public key cryptog- raphy
eng
dc.subject
Side channel hardening
eng
dc.subject
ECDH
eng
dc.subject
EdDSA
eng
dc.subject
ECDSA
eng
dc.subject
FPGA
eng
dc.title
Versatile Hardware Framework for Elliptic Curve Cryptography
eng
dc.type
stať ve sborníku
cze
dc.type
conference paper
eng
dc.relation.projectid
info:eu-repo/grantAgreement/Ministry of Interior/VJ/VJ02010010/CZ/Tools for AI-enhanced Security Verification of Cryptographic Devices/AI-SecTools
dc.rights.access
openAccess
dc.type.status
Peer-reviewed
dc.type.version
acceptedVersion
dc.relation.conference
25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems