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FITEXC – DIFFRACTION PROFILE FITTING PROGRAM RUN IN MS EXCEL



dc.contributor.authorVertat, Petr
dc.contributor.authorDrahokoupil, Jan
dc.date.accessioned2023-01-18T15:13:50Z
dc.date.available2023-01-18T15:13:50Z
dc.date.issued2018
dc.identifier.citationActa Polytechnica. 2018, vol. 17, no. 0, p. 20-23.
dc.identifier.issn1210-2709 (print)
dc.identifier.issn1805-2363 (online)
dc.identifier.urihttp://hdl.handle.net/10467/106041
dc.description.abstractWe present our custom made diffraction fitting program FitExc for the basic treatment of the 1D diffraction profiles, in particular, the Intensity(2θ) of X-ray, synchrotron or neutron diffraction measurements. In the current state, the program allows for simultaneous fitting of up to three profiles in one data set and is intended to be used mainly for precise lattice parameters determination or fitting of overlapped peaks. The entire program is built in the common MS Excel environment, it does not require any installation and is free to use.en
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherČeské vysoké učení technické v Prazecs
dc.publisherCzech Technical University in Pragueen
dc.relation.ispartofseriesActa Polytechnica
dc.relation.urihttps://ojs.cvut.cz/ojs/index.php/APP/article/view/4964
dc.rightsCreative Commons Attribution 4.0 International Licenseen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.titleFITEXC – DIFFRACTION PROFILE FITTING PROGRAM RUN IN MS EXCEL
dc.typearticleen
dc.date.updated2023-01-18T15:13:51Z
dc.identifier.doi10.14311/APP.2018.17.0020
dc.rights.accessopenAccess
dc.type.statusPeer-reviewed
dc.type.versionpublishedVersion


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