Prohlížení dle autora "Benda, V."
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OCVD Carrier Lifetime in P+NN+ Diode Structures With Axial Carrier Lifetime Gradient
Autor: Benda, V.; Černík, M.; Papež, V.
(2006)The OCVD (open circuit voltage decay) method is the generally used method for the determining of carrier lifetime in the structures of semiconductor devices. This paper is focused on power diode (PCNNC) structures, in ...