THE GOODNESS OF SIMULTANEOUS FITS IN ISIS
Typ dokumentu
articlePeer-reviewed
publishedVersion
Autor
Kühnel , Matthias
Falkner , Sebastian
Grossberger , Christoph
Ballhausen , Ralf
Dauser , Thomas
Schwarm , Fritz-Walter
Kreykenbohm , Ingo
Nowak A., Michael
Pottschmidt , Katja
Ferrigno , Carlo
Rothschild E., Richard
Martínez-Núñez , Silvia
Torrejón , José Miguel
Fürst , Felix
Klochkov , Dmitry
Staubert , Rüdiger
Kretschmar , Peter
Wilms , Jörn
Práva
Creative Commons Attribution 4.0 International Licensehttp://creativecommons.org/licenses/by/4.0/
openAccess
Metadata
Zobrazit celý záznamAbstrakt
In a previous work, we introduced a tool for analyzing multiple datasets simultaneously, which has been implemented into ISIS. This tool was used to fit many spectra of X-ray binaries. However, the large number of degrees of freedom and individual datasets raise an issue about a good measure for a simultaneous fit quality. We present three ways to check the goodness of these fits: we investigate the goodness of each fit in all datasets, we define a combined goodness exploiting the logical structure of a simultaneous fit, and we stack the fit residuals of all datasets to detect weak features. These tools are applied to all RXTE-spectra from GRO 1008−57, revealing calibration features that are not detected significantly in any single spectrum. Stacking the residuals from the best-fit model for the Vela X-1 and XTE J1859+083 data evidences fluorescent emission lines that would have gone undetected otherwise.
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