Surface leaky waves and their measurement
Typ dokumentu
příspěvek z konference - tištěnýAutor
Zehentner, Ján
Macháč, Jan
Mrkvica, Jan
Sarnowski, Marcin K.
Polívka, Jiří
Práva
© 1998 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Metadata
Zobrazit celý záznamAbstrakt
A new approach to experimental identification of surface leaky waves on printed-circuit lines is presented in this paper. Active radiometry is used for field probing even in the near field zone. The measurement is adjusted into the X band. The method is demonstrated on the slotline. Consequently the line is scaled in order to investigate the 1st and 2nd leaky waves which, on a standard-sized substrate, occur in the mm-wave range only. The high rate of polarization distinctness of the probe enables us to distinguish particular field components. We present the first very promising results.
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