Browsing Publikační činnost ČVUT by Author "Ballif C."

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    • Thin-film limit formalism applied to surface defect absorption 

      Author: Holovský J.; Ballif C.
      (Optical Society of America, 2014)
      The thin-film limit is derived by a nonconventional approach and equations for transmittance, reflectance and absorptance are presented in highly versatile and accurate form. In the thin-film limit the optical properties ...