Prohlížení Publikační činnost ČVUT dle autora "Ballif C."
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Thin-film limit formalism applied to surface defect absorption
Autor: Holovský J.; Ballif C.
(Optical Society of America, 2014)The thin-film limit is derived by a nonconventional approach and equations for transmittance, reflectance and absorptance are presented in highly versatile and accurate form. In the thin-film limit the optical properties ...