THE GOODNESS OF SIMULTANEOUS FITS IN ISIS
dc.contributor.author | Kühnel , Matthias | |
dc.contributor.author | Falkner , Sebastian | |
dc.contributor.author | Grossberger , Christoph | |
dc.contributor.author | Ballhausen , Ralf | |
dc.contributor.author | Dauser , Thomas | |
dc.contributor.author | Schwarm , Fritz-Walter | |
dc.contributor.author | Kreykenbohm , Ingo | |
dc.contributor.author | Nowak A., Michael | |
dc.contributor.author | Pottschmidt , Katja | |
dc.contributor.author | Ferrigno , Carlo | |
dc.contributor.author | Rothschild E., Richard | |
dc.contributor.author | Martínez-Núñez , Silvia | |
dc.contributor.author | Torrejón , José Miguel | |
dc.contributor.author | Fürst , Felix | |
dc.contributor.author | Klochkov , Dmitry | |
dc.contributor.author | Staubert , Rüdiger | |
dc.contributor.author | Kretschmar , Peter | |
dc.contributor.author | Wilms , Jörn | |
dc.date.accessioned | 2017-02-09T11:26:16Z | |
dc.date.available | 2017-02-09T11:26:16Z | |
dc.date.issued | 2016 | |
dc.identifier.citation | Acta Polytechnica. 2016, vol. 56, no. 1, p. 41-46. | |
dc.identifier.issn | 1210-2709 (print) | |
dc.identifier.issn | 1805-2363 (online) | |
dc.identifier.uri | http://hdl.handle.net/10467/67239 | |
dc.description.abstract | In a previous work, we introduced a tool for analyzing multiple datasets simultaneously, which has been implemented into ISIS. This tool was used to fit many spectra of X-ray binaries. However, the large number of degrees of freedom and individual datasets raise an issue about a good measure for a simultaneous fit quality. We present three ways to check the goodness of these fits: we investigate the goodness of each fit in all datasets, we define a combined goodness exploiting the logical structure of a simultaneous fit, and we stack the fit residuals of all datasets to detect weak features. These tools are applied to all RXTE-spectra from GRO 1008−57, revealing calibration features that are not detected significantly in any single spectrum. Stacking the residuals from the best-fit model for the Vela X-1 and XTE J1859+083 data evidences fluorescent emission lines that would have gone undetected otherwise. | en |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | |
dc.publisher | České vysoké učení technické v Praze | cs |
dc.publisher | Czech Technical University in Prague | en |
dc.relation.ispartofseries | Acta Polytechnica | |
dc.relation.uri | https://ojs.cvut.cz/ojs/index.php/ap/article/view/3047 | |
dc.rights | Creative Commons Attribution 4.0 International License | en |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | |
dc.subject | Methods: data analysis | en |
dc.subject | X-rays: binaries | en |
dc.title | THE GOODNESS OF SIMULTANEOUS FITS IN ISIS | |
dc.type | article | en |
dc.date.updated | 2017-02-09T11:26:16Z | |
dc.identifier.doi | 10.14311/APP.2016.56.0041 | |
dc.rights.access | openAccess | |
dc.type.status | Peer-reviewed | |
dc.type.version | publishedVersion |
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