Influence of Magnetostriction of NiFe Electroplated Film on the Noise of Fluxgate

Abstract

We electroplated NiFe thin-film over a copper layer using different current density. Magnetostriction is changed from negative to positive values, with minimum magnetostriction found at around Fe19Ni81 composition. When we used these ring cores as base for a fluxgate we observed that the noise rapidly rises as the absolute value of magnetostriction increases, while the minimum noise is achieved at lowest value of magnetostriction.