Prohlížení dle předmětu "stuck-at fault"
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ZATPG: SAT-based Test Patterns Generator with Zero-Aliasing in Temporal Compaction
(Elsevier Science, 2018)Aliasing in test response compaction is an important source of fault coverage loss. Methods to avoid the aliasing mostly require modification of the compactor to some extent. This can lead to a higher compactor complexity ...